The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 1979

Filed:

Sep. 19, 1977
Applicant:
Inventors:

James M Lafferty, Schenectady, NY (US);

Kei-Hsiung Yang, Schenectady, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
2503 / ; 2503 / ;
Abstract

Electrostatic x-ray imaging apparatus of the type having a gas-filled chamber bounded by a photocathode and a charge-receiving sheet anode has a control mesh positioned in the gas-filled gap and maintained at a positive voltage with respect to the cathode to facilitate high avalanche amplification and has a voltage between the mesh member and the anode chosen in the plateau region of the x-ray photocurrent versus voltage curve, to achieve a nearly constant efficiency of charge collection at the anode, independent of accumulation of charge thereat.


Find Patent Forward Citations

Quick Actions:

Lafferty, James. (1979). X-ray imaging apparatus with control mesh (U.S. Patent No. 4156140). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4156140

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…