Ramsey, MN, United States of America

James Kunkel

This inventor holds 1 USPTO granted patent. Top assignee: Hoya Optical Labs of America, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Kunkel. Retrieved from https://idiyas.com/inventor/james-kunkel-973cizxm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: James Kunkel: Innovator in Lens Technology

Introduction

James Kunkel is a notable inventor based in Ramsey, MN (US). He has made significant contributions to the field of lens technology, particularly in the development of systems that enhance the functionality of lenses.

Latest Patents

Kunkel holds 1 patent for his invention titled "Functional Layer Application System." This patent describes systems and methods for adding a functional layer to a lens that incorporates a plurality of microlenses. The invention aims to inhibit ametropia by utilizing defocus incorporated multiple segments (DIMS) that produce refraction areas with varying refraction forces. The process may involve injection molding to integrate a functional layer into the DIMS lens, which can provide various functionalities such as photochromic and polarization features.

Career Highlights

James Kunkel is currently employed at Hoya Optical Labs of America, Inc., where he continues to innovate in lens technology. His work focuses on enhancing the performance and utility of optical products.

Collaborations

Kunkel collaborates with Craig Drury, a coworker who shares his passion for advancing lens technology.

Conclusion

James Kunkel's contributions to lens technology through his innovative patent demonstrate his commitment to improving optical solutions. His work at Hoya Optical Labs of America, Inc. continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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