The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2026
Filed:
Dec. 04, 2023
Applicant:
Hoya Optical Labs of America, Inc., Lewisville, TX (US);
Inventors:
Assignee:
HOYA Optical Labs of America, Inc., Lewisville, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01);
U.S. Cl.
CPC ...
B29D 11/00365 (2013.01); B29D 11/00432 (2013.01);
Abstract
Systems and methods for adding a functional layer to a lens having a plurality of microlenses for inhibition of ametropia. The lens may include defocus incorporated multiple segments (DIMS) having a plurality of microlenses or lenslets producing refraction areas with different refraction forces. Injection molding may be utilized to add a functional layer to such a DIMS lens having a plurality of microlenses or lenslets. The functional layer may add a functional utility to the lens, including but not limited to photochromic functionality, polarization functionality, and the like.