This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: James Hendershot: Innovator in Charged Particle Beam Technology
Introduction
James Hendershot is a notable inventor based in Grant's Pass, Oregon. He has made significant contributions to the field of charged particle beam systems. His innovative work has led to the development of a unique ion beam source that enhances the extraction of charged particles from gas.
Latest Patents
Hendershot holds a patent for a "Multiple input split ring resonator ion beam source." This invention describes embodiments of charged particle beam systems, components, and methods for extracting charged particles from a gas. The charged particle source includes a resonator with a dielectric substrate that defines a first side and a second side. The resonator features a first conductive layer on the first side, which is patterned to include a ring portion with a gap. Additionally, a second conductive layer is present on the second side, and a source electrode is positioned proximal to the first side, offset from the dielectric substrate. This innovative design enhances the efficiency of charged particle extraction.
Career Highlights
James Hendershot has dedicated his career to advancing technology in the field of ion beam systems. His work at Fei Company has allowed him to collaborate with other experts in the field and contribute to groundbreaking advancements. His patent reflects his commitment to innovation and the pursuit of excellence in engineering.
Collaborations
Hendershot has worked alongside John Stiller, a fellow innovator in the field. Their collaboration has fostered an environment of creativity and technical advancement, leading to significant contributions to charged particle technology.
Conclusion
James Hendershot's contributions to the field of charged particle beam technology are noteworthy. His innovative patent and collaboration with other experts highlight his dedication to advancing scientific knowledge and engineering practices. His work continues to influence the development of new technologies in this specialized area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
