Austin, TX, United States of America

James F Headley

This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro Devices Corporation. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James F Headley. Retrieved from https://idiyas.com/inventor/james-f-headley-d6kga67y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: James F Headley: Innovator in Microprocessor Testing

Introduction

James F Headley is a notable inventor based in Austin, TX, recognized for his contributions to the field of microprocessor technology. He has developed innovative methods that enhance the reliability and performance of microprocessors, ensuring they operate without errors or defects.

Latest Patents

James F Headley holds a patent for a "Method and apparatus for intrusive testing of the performance-enhancing features" of microprocessors. This invention provides a systematic approach to testing microprocessors by utilizing an intrusive testing unit that generates logic signals. This method allows for the thorough examination of control circuitry, ensuring that software instructions executed by the microprocessor yield accurate results.

Career Highlights

James F Headley is associated with Advanced Micro Devices Corporation, where he applies his expertise in microprocessor technology. His work focuses on improving the performance and reliability of microprocessors, contributing significantly to advancements in the field.

Collaborations

James has collaborated with notable colleagues, including Charles T Bloomer and Jody A McCoy, to further enhance the development of microprocessor technologies.

Conclusion

James F Headley's innovative work in microprocessor testing exemplifies the importance of rigorous testing methods in technology. His contributions continue to influence the reliability of microprocessors in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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