The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
Nov. 15, 1995
Charles T Bloomer, Austin, TX (US);
James F Headley, Austin, TX (US);
Jody A McCoy, Austin, TX (US);
Leo J Klaes, Jr, Austin, TX (US);
Advanced Micro Devices, , US;
Abstract
The present invention includes a method and apparatus for performing intrusive testing upon a microprocessor to ensure the absence of errors or defects in performance-enhancing features and related control circuitry which affect the results of software instructions being executed by the microprocessor. In the intrusive testing method, an intrusive testing unit capable of generating logic signals is coupled between a computer system motherboard and a microprocessor. The microprocessor is then caused to execute a test software program. As the microprocessor executes the test software program, the intrusive testing unit generates logic signals (alternate control signals) at regular intervals. Control signals generated by system hardware on the motherboard in response to program execution are logically combined with alternate control signals generated by the intrusive testing unit. Resulting output control signals are applied to the control signal pins of the microprocessor. The intrusive testing unit thus ensures a large number of control signals are applied to the microprocessor in a relatively short period of time. The computer system is monitored to determine proper execution of the test software program.