Greer, SC, United States of America

James Edward Cencula

USPTO Granted Patents = 8 

 

Average Co-Inventor Count = 4.4

ph-index = 6

Forward Citations = 298(Granted Patents)


Location History:

  • Middletown, OH (US) (1994)
  • Ballston Lake, NY (US) (1997)
  • Neenah, WI (US) (2008)
  • Greer, SC (US) (2019 - 2021)

Company Filing History:


Years Active: 1994-2021

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8 patents (USPTO):

Title: Innovations of James Edward Cencula

Introduction

James Edward Cencula is a notable inventor based in Greer, South Carolina, with a remarkable portfolio of eight patents. His work primarily focuses on advancements in wind turbine technology, showcasing his commitment to innovation in renewable energy.

Latest Patents

Cencula's latest patents include a "System and method for monitoring wear on a gearbox of a wind turbine." This invention is designed to monitor the wear on a gearbox by utilizing a controller that determines the torque exerted on the rotor shaft or generator shaft based on measurement signals from a sensor. Additionally, he has developed a "Repair method for a gearbox assembly of a wind turbine," which outlines a process for repairing gearbox assemblies, allowing for easier disassembly and assembly of components.

Career Highlights

Throughout his career, Cencula has worked with prominent companies such as General Electric Company and General Electric Renovables España, S.L. His experience in these organizations has contributed significantly to his expertise in the field of wind energy technology.

Collaborations

Cencula has collaborated with notable professionals in his field, including Hahn M. Spofford and Donald L. Bellia. These collaborations have likely enriched his work and contributed to the development of his innovative patents.

Conclusion

James Edward Cencula's contributions to wind turbine technology through his patents and career experiences highlight his role as a significant inventor in the renewable energy sector. His innovative solutions continue to pave the way for advancements in this critical field.

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