This inventor holds 1 USPTO granted patent. Top assignee: USA as Represented by Secretary of the Navy. Active years: 2007.
Company Filing History:
Years Active: 2007
Title: James E Hooper: Innovator in Projectile Impact Measurement Systems
Introduction
James E Hooper is a notable inventor based in Tiverton, Rhode Island, who has made significant contributions to the field of projectile impact measurement. With a focus on innovative technologies, he has developed a unique system that enhances the accuracy of measuring projectile impacts.
Latest Patents
Hooper holds a patent for a "Projectile impact energy and location measurement system." This system employs a target apparatus featuring an impact plate made of durable materials such as steel or titanium. Over this plate, a layer of elastoluminescent material, composed of zinc sulfide and manganese embedded in an elastomeric composite, is placed. This luminescent material emits light when elastically strained, such as during a projectile strike. Optical photosensitive sensors are strategically deployed to capture color images of the target before, during, and after impact. These images record the target's luminescence and the impact location of the projectile. The data is transmitted to an image processing system that isolates the impact location and correlates the light wavelength with a known kinetic energy value obtained through initial calibration.
Career Highlights
Hooper works for the United States as represented by the Secretary of the Navy. His role involves applying his innovative ideas to enhance military technologies and improve measurement systems.
Collaborations
Throughout his career, Hooper has collaborated with notable colleagues, including Derke R Hughes and Jeffrey T Feaster. These collaborations have contributed to the advancement of technologies in projectile impact measurement.
Conclusion
James E Hooper's work in developing a projectile impact energy and location measurement system showcases his innovative spirit and dedication to advancing technology. His contributions are significant in the field of measurement systems, reflecting his expertise and commitment to innovation.