The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Jul. 17, 2006
Derke R. Hughes, Warwick, RI (US);
Jeffrey T. Feaster, Wakefield, RI (US);
James E. Hooper, Tiverton, RI (US);
Derke R. Hughes, Warwick, RI (US);
Jeffrey T. Feaster, Wakefield, RI (US);
James E. Hooper, Tiverton, RI (US);
The United States of America as represented by Secretary of the Navy, Washington, DC (US);
Abstract
A projectile impact energy and location measurement system is taught employing a target apparatus having an impact plate of a solid durable substance such as steel or titanium. Disposed over the plate is a layer of elastoluminescent material composed of zinc sulfide and manganese embedded in an elastomeric composite. This luminescent material is designed to emit light or exhibit luminescence when elastically strained, for example when a projectile strikes the material. Optical photosensitive sensors are deployed at strategic locations to observe and record color images of the target before during and after impact by a projectile. These images capture the target luminescence and impact location of the projectile. The images are transmitted to a traditional image processing system that can isolate the impact location and correlate the light wave length with a known kinetic energy value that was obtained through initial calibration of the system.