Aberdeen Proving Ground, MD, United States of America

James C Gurganus

This inventor holds 1 USPTO granted patent. Top assignee: Johns Hopkins University. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of James C. Gurganus

Introduction

James C. Gurganus is an accomplished inventor based at Aberdeen Proving Ground, MD (US). He has made significant contributions to the field of sensor technology, particularly with his innovative designs that enhance the detection of forces and strains.

Latest Patents

One of his notable patents is the "Blunt Force Sensor Array." This invention features a flexible thin-film substrate that can be applied to non-planar surfaces. The array includes a plurality of force sensors and a strain gauge, all secured to the substrate near a central measurement point. The sensor interface connects to external measurement and control circuitry, allowing for effective monitoring of blunt force events. The design's flexibility enables it to conform to various surfaces, making it a versatile tool for detecting forces and strains.

Career Highlights

James C. Gurganus is affiliated with Johns Hopkins University, where he continues to work on advancing sensor technologies. His expertise in this area has led to the development of innovative solutions that address real-world challenges.

Collaborations

Throughout his career, Gurganus has collaborated with several notable colleagues, including Edwin B. Gienger, Iv, and John B. Helder. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

James C. Gurganus is a prominent inventor whose work in sensor technology has made a significant impact. His innovative designs, particularly the Blunt Force Sensor Array, showcase his commitment to advancing the field. His contributions continue to influence the development of new technologies that enhance our understanding of force and strain detection.

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