The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2026
Filed:
Jan. 31, 2022
The Johns Hopkins University, Baltimore, MD (US);
Edwin B. Gienger, IV, Washington, DC (US);
John B. Helder, Columbia, MD (US);
Morgana M. Trexler, Baltimore, MD (US);
Catherine M. Carneal, Silver Spring, MD (US);
Christopher J. Dohopolski, Baltimore, MD (US);
James C. Gurganus, Aberdeen Proving Ground, MD (US);
William H. Mermagen, Aberdeen Proving Ground, MD (US);
Michael S. Horsmon, Gunpowder, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A blunt force sensor array for application to a non-planar surface includes a flexible thin-film substrate, a plurality of force sensors secured to the flexible thin-film substrate proximate to a center measurement point, a strain gauge secured on the flexible thin-film substrate proximate to the center measurement point, and a sensor interface configured to connect to external measurement and control circuitry. The sensor interface may be electrically connected to each of the force sensors and the strain gauge via traces disposed on the flexible thin-film substrate. The flexibility and shape of the flexible thin-film substrate may permit the blunt force sensor array to be applied to the non-planar surface to detect forces and strains experienced by the non-planar surface in response to a blunt force event on the non-planar surface.