San Jose, CA, United States of America

James C Anderson

This inventor holds 1 USPTO granted patent. Top assignee: Advantest (Singapore) Pte Ltd. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James C Anderson. Retrieved from https://idiyas.com/inventor/james-c-anderson-yln7h7iy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: James C Anderson: Innovator in Semiconductor Testing

Introduction

James C Anderson is a notable inventor based in San Jose, California. He has made significant contributions to the field of semiconductor testing, showcasing his expertise through his innovative patent.

Latest Patents

James C Anderson holds a patent for "Methods, apparatus and articles of manufacture for testing a plurality of singulated die." This patent outlines a method for testing semiconductor die, which involves placing each die on a die carrier, mating an array of electrical contactors with the die, and performing electrical tests through these contactors. This invention enhances the efficiency and accuracy of semiconductor testing processes.

Career Highlights

Anderson is currently employed at Advantest (Singapore) Pte Ltd, where he continues to develop and refine technologies in the semiconductor industry. His work has been instrumental in advancing testing methodologies that are crucial for the performance of electronic devices.

Collaborations

Some of his notable coworkers include Alan D Hart and Kenneth D Karklin, who have collaborated with him on various projects within the semiconductor testing domain.

Conclusion

James C Anderson's contributions to semiconductor testing through his innovative patent reflect his dedication to advancing technology in this critical field. His work continues to influence the industry and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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