San Jose, CA, United States of America

Jagannatha Narayanareddy

This inventor holds 2 USPTO granted patents. Top assignee: Yahoo! Inc.. Active years: 2007-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jagannatha Narayanareddy. Retrieved from https://idiyas.com/inventor/jagannatha-narayanareddy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 3.7

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2007-2010

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2 patents (USPTO):Explore Patents

Title: Innovations by Jagannatha Narayanareddy

Introduction

Jagannatha Narayanareddy is a notable inventor based in San Jose, California. He has made significant contributions to the field of data processing and quality measurement through his innovative patents. With a total of two patents to his name, Narayanareddy continues to push the boundaries of technology.

Latest Patents

His latest patents include "Extraction of logical events from network data" and "Method and system of measuring data quality." The first patent focuses on optimizing the evaluation of records against multiple conditions, ensuring efficiency by minimizing the number of scans required. The second patent provides a comprehensive approach to measuring data quality within data processing streams, utilizing various components to assess both input and output data.

Career Highlights

Jagannatha Narayanareddy is currently employed at Yahoo! Inc., where he applies his expertise in data processing and quality measurement. His work has been instrumental in enhancing the efficiency and reliability of data systems.

Collaborations

He has collaborated with notable coworkers such as Peiji Chen and Long-ji Lin, contributing to various projects that leverage their combined expertise in technology and data processing.

Conclusion

Jagannatha Narayanareddy's innovative patents and contributions to data processing highlight his role as a significant figure in the field. His work continues to influence advancements in technology and data quality measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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