The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Mar. 10, 2006
Peiji Chen, Saratoga, CA (US);
Long-ji Lin, San Jose, CA (US);
Jagannatha Narayanareddy, San Jose, CA (US);
Peiji Chen, Saratoga, CA (US);
Long-Ji Lin, San Jose, CA (US);
Jagannatha Narayanareddy, San Jose, CA (US);
Yahoo! Inc., Sunnyvale, CA (US);
Abstract
Data quality measurement is provided for use in a data processing stream, which comprises at least one upstream data processing system and at least one downstream data processing system. An input alert component can be used to provide a measurement of data prior to its input to a data processing system (e.g., a downstream data processing system or an upstream data processing system). An output alert component can be used to provide a measurement on data output by a data processing system. A self-consistency component can be used to measure consistency between items of input, or output data. An end-to-end component can be used to measure data quality using data items from both input data and output data. These components can be used in some combination, or independent of the other, and in any order. In addition, the data quality measurements can be performed separate from that processing performed by either the upstream or downstream processing system.