Seoul, South Korea

Jae Young Rim

This inventor holds 1 USPTO granted patent. Top assignee: Siliconfile Technologies Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Young Rim. Retrieved from https://idiyas.com/inventor/jae-young-rim-x45l9kc0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Jae Young Rim: Innovator in Image Sensor Technology

Introduction

Jae Young Rim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of image sensor technology. His innovative work focuses on reducing crosstalk in image sensors, which is crucial for enhancing image quality.

Latest Patents

Jae Young Rim holds a patent for an "Image sensor having anti-reflection film for reducing crosstalk." This invention includes anti-reflection films that are strategically placed between metal wire lines and a semiconductor substrate. The design aims to minimize color crosstalk and noise, thereby improving the performance of image sensors compared to conventional models.

Career Highlights

Rim is currently employed at Siliconfile Technologies Inc., where he continues to develop cutting-edge technologies in the imaging sector. His work has garnered attention for its potential to revolutionize how image sensors operate in various applications.

Collaborations

Some of his notable coworkers include Jun Ho Won and Se Jung Oh, who contribute to the innovative environment at Siliconfile Technologies Inc. Their collaborative efforts enhance the development of advanced imaging solutions.

Conclusion

Jae Young Rim's contributions to image sensor technology exemplify the impact of innovation in enhancing image quality. His patent for reducing crosstalk showcases his commitment to advancing this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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