Anyang, South Korea

Jae Sung Kim

This inventor holds 1 USPTO granted patent. Top assignees: Hyundai Motor Company, Kia Motors Company, Yonsei University. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jae Sung Kim. Retrieved from https://idiyas.com/inventor/jae-sung-kim-03e53je6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Jae Sung Kim: Innovator in Vehicle Detection Technology

Introduction

Jae Sung Kim is a prominent inventor based in Anyang-Gyeonggi-Do, South Korea. He has made significant contributions to the field of vehicle detection technology. His innovative approach has led to the development of a unique vehicle detecting method and system.

Latest Patents

Jae Sung Kim holds 1 patent for his invention titled "Vehicle Detecting Method and System." This patent describes a method that involves creating a disparity map using images captured by a stereoscopic imaging device. The system is designed to detect road areas and identify vehicles present in those areas as stereoscopic objects.

Career Highlights

Throughout his career, Jae Sung Kim has worked with notable companies in the automotive industry, including Hyundai Motor Company and Kia Motors. His experience in these organizations has allowed him to refine his skills and contribute to advancements in vehicle technology.

Collaborations

Some of his coworkers include Jin Ha Choi and Dae Hwan Kim. Their collaboration has likely played a role in the development of innovative solutions in the automotive sector.

Conclusion

Jae Sung Kim's work in vehicle detection technology exemplifies the impact of innovation in the automotive industry. His contributions continue to shape the future of vehicle safety and detection systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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