This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Corporation. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Jack C Lindell: Innovator in Atom-Interferometric Technology
Introduction
Jack C Lindell is a notable inventor based in Plainview, NY (US). He has made significant contributions to the field of gravity measurement through his innovative work in atom interferometry. With a focus on enhancing measurement systems, Lindell has developed a unique approach that stands out in the industry.
Latest Patents
Lindell holds a patent for an "Atom-interferometric, stepped gravity gradient measuring system." This full-tensor gravity gradient measuring system utilizes atom interferometry to achieve precise measurements. Each axis in the three-axis measuring system is equipped with a different gravity gradiometer, which consists of three pairs of atom interferometric accelerometers. These accelerometers are strategically mounted on opposite sides of the gradiometer's rotation axis, allowing for improved signal-to-noise performance. The innovative design features step-rotation of the accelerometer pairs, which enhances the overall measurement accuracy while reducing costs compared to prior-art techniques.
Career Highlights
Lindell is currently associated with Lockheed Martin Corporation, where he continues to push the boundaries of technology in his field. His work has garnered attention for its practical applications and advancements in measurement systems. With a patent count of 1 patent, Lindell's contributions are recognized within the industry.
Collaborations
Throughout his career, Lindell has collaborated with esteemed colleagues such as Hugh F Rice and Daniel J DiFrancesco. These partnerships have fostered innovation and have been instrumental in the development of advanced measurement technologies.
Conclusion
Jack C Lindell's work in atom interferometry represents a significant advancement in gravity measurement systems. His innovative approach and collaboration with industry professionals highlight his commitment to enhancing technology in this field. Lindell's contributions will undoubtedly continue to influence future developments in measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile