The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2013
Filed:
Sep. 15, 2008
Hugh F. Rice, New Rochelle, NY (US);
Jack C. Lindell, Plainview, NY (US);
Daniel J. Difrancesco, North Tonawanda, NY (US);
Hugh F. Rice, New Rochelle, NY (US);
Jack C. Lindell, Plainview, NY (US);
Daniel J. DiFrancesco, North Tonawanda, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A full-tensor, gravity gradient measuring system is disclosed that is based on atom interferometry. Each axis in the three-axis measuring system is served by a different gravity gradiometer, where each gradiometer comprises three pairs of atom interferometric (AI) accelerometers. The accelerometers in each pair are mounted on opposite sides of the gradiometer's rotation axis from each other. The three AI accelerometer pairs are step-rotated, instead of being continuously rotated, thereby providing enhanced signal-to-noise performance. The three gradiometers in the overall measuring system are mounted orthogonally with respect to one another on a local-level platform, in order to achieve a full-tensor measuring system. The measuring system can be step-rotated as an overall unit around an axis perpendicular to a local level reference. The multiple levels of stepped rotation, as enabled by the atom interferometry being utilized, yields improved results with lower costs than what is achievable with some prior-art techniques.