This inventor holds 74 USPTO granted patents, primarily in Image Formation Technology (CPC class 430 ). Top assignees: Minolta Camera Kabushiki Kaisha, Minolta Company, Ltd., Toeisangyo Co., Ltd.. Active years: 1987-2001.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Izumi Osawa. Retrieved from https://idiyas.com/inventor/izumi-osawa
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 3.5
ph-index = 12
Forward Citations = 580(Granted Patents)
Forward Citations (Not Self Cited) = 483(Dec 10, 2025)
Inventors with similar research interests:
Location History:
- Osaka, JP (1989 - 1996)
- Ikeda, JP (1987 - 2001)
Company Filing History:
Minolta Camera Kabushiki Kaisha

Minolta Company, Ltd.
Toeisangyo Co., Ltd.
4. 1 out of 834,453 patents
Other
where one patent can have more than one assignee
Years Active: 1987-2001
Loading Chart...
Areas of Expertise:
Photosensitive Member
Image Forming Apparatus
Contact Charger
Ink Jet Recording Head
Electrostatic Charging
Organic Photosensitive Member
Protective Layer
Cleaning Device
Developer
Production Method
Magnetic Particle
Image Formation Method
74 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Izumi Osawa. Retrieved from https://idiyas.com/inventor/izumi-osawa
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]