Hiratsuka, Japan

Iwao Hayashi

This inventor holds 1 USPTO granted patent. Top assignee: Kansai Paint Company, Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Iwao Hayashi. Retrieved from https://idiyas.com/inventor/iwao-hayashi-yg9vxmof

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2009

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Iwao Hayashi: Innovator in Semiconductor Technology

Introduction

Iwao Hayashi is a notable inventor based in Hiratsuka, Japan. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for forming semiconductor films.

Latest Patents

Hayashi holds a patent titled "Method for forming semiconductor film and use of semiconductor film." This invention provides a process for forming a semiconductor film by applying a semiconductor particle dispersion liquid to a substrate surface through spray coating. The atomized droplets of the dispersion liquid have a mean diameter of about 30 µm or less. The process concludes with drying the coating to create a porous semiconductor film, which has various applications.

Career Highlights

Iwao Hayashi is associated with Kansai Paint Company, Ltd., where he has been instrumental in advancing semiconductor technologies. His work has garnered attention for its practical applications in the industry.

Collaborations

Hayashi collaborates with Masahide Kawaraya, contributing to the innovative projects at their company.

Conclusion

Iwao Hayashi's contributions to semiconductor technology through his patented methods highlight his role as a key innovator in the field. His work continues to influence advancements in semiconductor applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…