Location History:
- Leicestershire, GB (2011)
- Leicester, GB (2008 - 2014)
Company Filing History:
Years Active: 2008-2014
Title: Ivor McDonnell: Innovator in Surface Measurement Technology
Introduction
Ivor McDonnell is a prominent inventor based in Leicester, GB. He has made significant contributions to the field of surface measurement technology, holding a total of 7 patents. His innovative work has advanced the capabilities of metrological instruments, enhancing precision and accuracy in measurements.
Latest Patents
Among his latest patents is a "Surface Measurement Instrument and Method." This invention describes a method for determining a correction parameter to align components of a metrological apparatus. The process involves positioning an artefact on a turntable, making measurements before and after rotation, and calculating the necessary correction parameter. Another notable patent is the "Surface Measurement Instrument," which focuses on obtaining surface characteristic data. This instrument utilizes relative movement between a reference surface and a sample support while a sensor captures light intensity, allowing for the derivation of surface characteristic data.
Career Highlights
Ivor McDonnell is currently associated with Taylor Hobson Limited, a company renowned for its precision measurement instruments. His work at Taylor Hobson has been instrumental in developing advanced technologies that cater to various industrial applications. His expertise in surface measurement has positioned him as a key figure in the field.
Collaborations
Ivor has collaborated with notable colleagues, including Andrew Douglas Bankhead and Daniel Ian Mansfield. These partnerships have fostered innovation and contributed to the successful development of new technologies in surface measurement.
Conclusion
Ivor McDonnell's contributions to surface measurement technology exemplify his dedication to innovation and precision. His patents and work at Taylor Hobson Limited continue to influence the industry, showcasing the importance of advancements in metrological instruments.