Company Filing History:
Years Active: 2014-2021
Title: Ivan Lazić: Innovator in Charged Particle Microscopy
Introduction
Ivan Lazić is a prominent inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of charged particle microscopy, holding a total of 3 patents. His innovative work focuses on enhancing imaging techniques that provide valuable insights into material structures and compositions.
Latest Patents
One of Ivan's latest patents is titled "System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy." This method involves directing charged particles towards a sample along a primary axis while simultaneously detecting portions of the charged particles transmitted through the sample. The design allows for the collection of complementary structural and compositional information. Another notable patent is the "Multi-beam scanning transmission charged particle microscope." This invention includes an apparatus that produces multiple charged particle beams to irradiate a specimen, enhancing the imaging capabilities of charged particle microscopy.
Career Highlights
Ivan Lazić is currently employed at FEI Company, where he continues to develop advanced microscopy techniques. His work has significantly impacted the field, leading to improved imaging methods that are crucial for research and industrial applications.
Collaborations
Ivan has collaborated with notable professionals in his field, including Eric Gerardus Bosch and Brian Routh, Jr. These collaborations have fostered innovation and contributed to the advancement of charged particle microscopy technologies.
Conclusion
Ivan Lazić is a key figure in the realm of charged particle microscopy, with a focus on developing methods that enhance imaging capabilities. His contributions are paving the way for future advancements in material science and imaging technologies.