Rehovot, Israel

Itamar Shani

USPTO Granted Patents = 3 

Average Co-Inventor Count = 4.9

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022-2025

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3 patents (USPTO):Explore Patents

Title: Itamar Shani: Innovator in Scanning Electron Microscopy

Introduction

Itamar Shani is a prominent inventor based in Rehovot, Israel. He has made significant contributions to the field of microscopy, particularly in the development of non-destructive imaging techniques. With a total of 3 patents, his work has advanced the capabilities of scanning electron microscopy.

Latest Patents

One of Itamar Shani's latest patents is focused on scanning electron microscopy-based tomography of specimens. This innovative system includes a scanning electron microscope (SEM) and processors designed to obtain a sinogram of a tested specimen. The SEM projects e-beams onto the specimen from various directions, measuring the intensity of returned electrons. The processors then create a tomographic map by determining values indicative of the specimen's components.

Another notable patent involves hybrid scanning electron microscopy and acousto-optic based metrology. This method allows for non-destructive measurement by combining acousto-optic and scanning electron microscopy data. The process includes obtaining measurement data, extracting key parameters, and using an algorithm to estimate structural parameters of the inspected structure.

Career Highlights

Itamar Shani is currently employed at Applied Materials Israel Limited, where he continues to innovate in the field of microscopy. His work has been instrumental in enhancing the accuracy and efficiency of imaging techniques used in various applications.

Collaborations

Throughout his career, Itamar has collaborated with notable colleagues, including Guy Shwartz and Konstantin Chirko. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.

Conclusion

Itamar Shani's contributions to scanning electron microscopy and metrology demonstrate his commitment to innovation in the field. His patents reflect a deep understanding of the complexities involved in non-destructive imaging techniques. Through his work at Applied Materials Israel Limited, he continues to push the boundaries of what is possible in microscopy.

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