This inventor holds 1 USPTO granted patent. Top assignee: Omron Tateisi Electronics Co.. Active years: 1988.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1988
Title: Isamu Ishida: Innovator in Ultrasonic Flaw Detection
Introduction
Isamu Ishida is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of ultrasonic flaw detection technology. His innovative approach has led to the development of a unique system that enhances the accuracy and reliability of flaw detection in various materials.
Latest Patents
Ishida holds a patent for an ultrasonic flaw detecting system. This system comprises a manual scanning unit equipped with a probe that produces a probe position data signal. It includes an ultrasonic flaw detector that transmits an ultrasonic signal to the probe and generates flaw detection data based on the received reflection echo signal. Additionally, a data collecting and recording unit receives both the flaw detection data and probe position data, recording them on an external medium. This portable flaw detection data collecting apparatus allows for flexible scanning operations, improving the accuracy and reliability of flaw detection compared to conventional automatic scanning units.
Career Highlights
Isamu Ishida is associated with Omron Tateisi Electronics Co., where he has been instrumental in advancing ultrasonic technology. His work has not only contributed to the company's reputation but has also set new standards in the industry for flaw detection systems.
Collaborations
Ishida has collaborated with notable colleagues such as Akira Abe and Kaneyoshi Katsumata. Their combined expertise has further enhanced the development of innovative technologies in the field.
Conclusion
Isamu Ishida's contributions to ultrasonic flaw detection technology exemplify the impact of innovation in engineering. His patented system represents a significant advancement in the ability to detect flaws accurately and reliably.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
