The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 1988
Filed:
Mar. 02, 1987
Omron Tateisi Electronics Co., Kyoto, JP;
Abstract
An ultrasonic flaw detecting system comprises a manual scanning unit equipped with a probe and capable of producing a probe position data signal, an ultrasonic flaw detector for transmitting an ultrasonic signal to the probe and producing flaw detection data on the basis of a reflection echo signal as received, and a data collecting/recording unit for receiving the flaw detection data from the ultrasonic flaw detector and the probe position data from the manual scanning unit to record both data on an external recording medium, wherein the scanning unit, the ultrasonic flaw detector and the data collecting/recording unit constitute a portable flaw detection data collecting apparatus. The data stored on the external recording medium can be loaded in a data processing apparatus installed at a predetermined location independent of the portable flaw detection data collecting apparatus to be thereby automatically processed for obtaining various information of flaw possibly present within an object to be tested. Due to the provision of the manually manipulatable scanning unit, the scanning operation for searching flaws can be effected in a flexible manner when compared with the conventional autonatic scanning unit, whereby flaw detection can be accomplished with an improved accuracy and high reliability.