Irith Pomeranz

Title: Irith Pomeranz: Innovator in Test Pattern Generation

Introduction

Irith Pomeranz is a prominent inventor based in West Lafayette, IN (US). She has made significant contributions to the field of automatic test pattern generation (ATPG) for circuit designs. Her work focuses on enhancing the reliability and efficiency of testing processes in electronic systems.

Latest Patents

Irith Pomeranz holds a patent titled "Deterministic test pattern generation for designs with timing exceptions." This patent describes systems and methods for a deterministic ATPG process that incorporates timing exception information. The method involves generating a test pattern for a targeted fault in a circuit design that includes at least one timing exception path. The process also includes testing the targeted fault using the generated test pattern to produce a test result.

Career Highlights

Irith Pomeranz is associated with Mentor Graphics Corporation, where she applies her expertise in electronic design automation. Her innovative approaches have contributed to advancements in the field, particularly in improving the accuracy of test pattern generation.

Collaborations

Irith has collaborated with notable colleagues, including Wu-Tung Cheng and Kun-Han Tsai. Their combined efforts have furthered research and development in the area of circuit design testing.

Conclusion

Irith Pomeranz is a trailblazer in the field of test pattern generation, with her patent and work at Mentor Graphics Corporation showcasing her commitment to innovation. Her contributions continue to impact the electronic design industry positively.