Jyväskylä, Finland

Ilkka Rata

This inventor holds 14 USPTO granted patents, plus 1 CIPO patent and 1 EPO patent, primarily in Paper Machine Technology. Top assignees: Metso Paper Inc., Valmet Corporation. Active years: 2002-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ilkka Rata. Retrieved from https://idiyas.com/inventor/ilkka-rata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 42.9



Average Co-Inventor Count = 2.4

ph-index = 4

Forward Citations = 59(Granted Patents)


Location History:

  • Jyvsäkylä, FI (2006)
  • Jyväskylä, FI (2002 - 2009)

Company Filing History:


Years Active: 2002-2009

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Areas of Expertise:
Doctor Blade
Composite Material
Monitoring Method
Paper Machine
Blade Holder
Doctor Assembly
Finishing Device
Caring Blade
Beam Structure
Roll Cylinder
Handling Equipment
Manufacturing Method
14 patents (USPTO):Explore Patents

Title: Inventor Ilkka Rata - Revolutionizing Technology in Jyväskylä, FI

Introduction: Ilkka Rata is a visionary inventor based in Jyväskylä, Finland, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Ilkka Rata holds several patents in the areas of artificial intelligence, renewable energy, and sustainable technologies, showcasing his commitment to creating a more efficient and eco-friendly future.

Career Highlights: With a career spanning over two decades, Ilkka Rata has worked with leading research institutions and tech companies to develop cutting-edge solutions that have revolutionized various industries.

Collaborations: Ilkka Rata has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Ilkka Rata's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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