Company Filing History:
Years Active: 2008-2010
Title: The Innovative Contributions of Ilan Hanoon
Introduction
Ilan Hanoon is a notable inventor based in Glenside, Pennsylvania, recognized for his contributions to the field of semiconductor testing. With a total of two patents to his name, Hanoon has made significant advancements in the technology used for integrated circuit testing.
Latest Patents
Hanoon's latest patents include "Probes for a Wafer Test Apparatus" and "Method and Apparatus for Producing Co-Planar Bonding Pads on a Substrate." The first patent describes a probe designed for testing integrated circuits, featuring a foot with a flat surface for substrate connection, a tip for contacting the integrated circuit, and a curved body for enhanced functionality. The second patent outlines a method for creating co-planar bonding pads on a substrate, which improves the accuracy of probe positioning during wafer testing.
Career Highlights
Throughout his career, Ilan Hanoon has worked with prominent companies such as Sv Probe Pte. Ltd. and Kulicke and Soffa Industries, Inc. His experience in these organizations has contributed to his expertise in semiconductor technology and testing methodologies.
Collaborations
Hanoon has collaborated with notable professionals in his field, including Edward Lambert Malantonio and Edward T Laurent. These collaborations have likely enriched his work and contributed to the development of innovative solutions in semiconductor testing.
Conclusion
Ilan Hanoon's contributions to the field of semiconductor testing through his patents and career experiences highlight his role as an influential inventor. His work continues to impact the industry positively.