This inventor holds 1 USPTO granted patent. Top assignee: Vlsi Technology Research Association. Active years: 1983.
Company Filing History:
Years Active: 1983
Title: Ikuro Kobayashi: Innovator in Surface Temperature Measurement
Introduction
Ikuro Kobayashi is a notable inventor based in Machida, Japan. He has made significant contributions to the field of temperature measurement through his innovative methods and systems. His work focuses on accurately measuring surface temperature distribution in samples with varying radiation factors.
Latest Patents
Kobayashi holds a patent for a "Method for measuring surface temperature distribution and system." This invention provides a method for easily measuring the surface temperature distribution of a sample consisting of multiple coexisting materials with different radiation factors at a specified temperature. The method involves keeping the sample at a known temperature and obtaining the amount of infrared rays radiated from several narrow regions on the surface of the sample. This measurement is performed at least twice at two known temperatures to derive temperature coefficients of infrared rays for each subdivided region. Subsequently, the unknown temperatures of these regions can be determined based on the measured infrared rays and temperature coefficients.
Career Highlights
Ikuro Kobayashi is associated with the VLSI Technology Research Association, where he applies his expertise in temperature measurement technologies. His work has contributed to advancements in the field, enhancing the accuracy and efficiency of temperature measurement methods.
Collaborations
Kobayashi collaborates with Kyozo Shimizu, furthering research and development in their respective fields. Their partnership exemplifies the importance of teamwork in driving innovation.
Conclusion
Ikuro Kobayashi's contributions to the field of surface temperature measurement highlight his innovative spirit and dedication to advancing technology. His patented methods provide valuable tools for accurately assessing temperature distribution in complex materials.