San Diego, CA, United States of America

IK-Joon Chang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Qualcomm Incorporated. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: IK-Joon Chang. Retrieved from https://idiyas.com/inventor/ik-joon-chang-uvelbx8d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: IK-Joon Chang: Innovator in Semiconductor Technology

Introduction

IK-Joon Chang is a notable inventor based in San Diego, CA. He has made significant contributions to the field of semiconductor technology, particularly in the area of power supply noise measurement.

Latest Patents

Chang holds a patent for an innovative on-chip sensor designed to measure dynamic power supply noise on semiconductor chips. This sensor addresses issues such as voltage droop, which can affect the performance of functional logic within the chip. The in-situ logic employed in this sensor is sensitive to noise present on the power supply, allowing for accurate measurements of operational delays caused by such noise.

Career Highlights

Chang is currently associated with Qualcomm Incorporated, a leading company in the telecommunications and semiconductor industry. His work focuses on enhancing the reliability and performance of semiconductor devices through innovative measurement techniques.

Collaborations

Chang collaborates with talented individuals in his field, including Xiaohua Kong and Mikhail Popovich, who contribute to the advancement of semiconductor technologies.

Conclusion

IK-Joon Chang's work in developing an on-chip sensor for measuring power supply noise exemplifies his commitment to innovation in semiconductor technology. His contributions are vital for improving the performance and reliability of modern electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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