Ignacio Lesser

Title: Ignacio Lesser: Innovator in Integrated Circuit Testing

Introduction

Ignacio Lesser is a notable inventor based in Buenos Aires, Argentina. He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.

Latest Patents

Ignacio Lesser holds a patent for a "Fault test circuit using launch-off-shift scan." This invention involves an integrated circuit sensor that utilizes a test program generator. The generator is designed to receive a portion of a scan vector, which includes a test mode signal and a scan enable signal. It retrieves a launch-off-capture test sequence from the scan vector and employs this sequence along with the test mode signal to create a launch-off-capture test signal. Additionally, a test signal generator produces a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is then configured to test the integrated circuit sensor using the launch-off-shift test signal. Ignacio Lesser has 1 patent to his name.

Career Highlights

Ignacio Lesser is currently associated with Allegro Microsystems, LLC, where he continues to develop innovative solutions in the realm of integrated circuits. His work has been instrumental in advancing testing methodologies for integrated circuit sensors.

Collaborations

Throughout his career, Ignacio has collaborated with talented individuals such as Nicolas Rigoni and Octavio H Alpago. These collaborations have contributed to the development of cutting-edge technologies in the field.

Conclusion

Ignacio Lesser's contributions to integrated circuit testing through his innovative patent highlight his role as a significant inventor in the industry. His work continues to influence advancements in technology and testing methodologies.