Allegro Microsystems, LLC

Ignacio Lesser

Octavio H Alpago

Nicolas Rigoni

Lautaro Casella

An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.

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Buenos Aires, Argentina

Ignacio Lesser