Kure, Japan

Ichirou Okamoto

This inventor holds 1 USPTO granted patent. Top assignee: Mitutoyo Corporation. Active years: 2005.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2005

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Ichirou Okamoto: Innovator in Measuring Instruments

Introduction

Ichirou Okamoto is a notable inventor based in Kure, Japan. He has made significant contributions to the field of measuring instruments, particularly through his innovative patent that enhances the precision of centroid moment calculations.

Latest Patents

Ichirou Okamoto holds a patent for a measuring instrument that calculates the centroid moments of components of an arm based on three-dimensional model data and the mass of the components. The centroid moments are combined to determine the centroid position (G) of the entire arm. This arm is designed to be adjusted and swingably supported, allowing a stylus provided at the end to touch a workpiece with a predetermined measuring force. The centroid position (G) is maintained on a horizontal plane that includes the fulcrum when the support is inclined by an angle within a specific range. This innovative design ensures that the measuring force remains stable even when the support is inclined.

Career Highlights

Ichirou Okamoto is associated with Mitutoyo Corporation, a leading company in precision measuring instruments. His work has contributed to advancements in measurement technology, enhancing the accuracy and reliability of various measuring applications.

Collaborations

Ichirou has collaborated with notable coworkers such as Nobuyuki Hama and Hideo Tanada, further enriching the innovative environment at Mitutoyo Corporation.

Conclusion

Ichirou Okamoto's contributions to measuring instruments exemplify the importance of innovation in enhancing precision and reliability in technology. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to improving measurement techniques.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…