Ichiro Honjo

Title: Ichiro Honjo: Innovator in Scanning Electron Microscopy

Introduction

Ichiro Honjo is a notable inventor based in Santa Clara, CA, who has made significant contributions to the field of scanning electron microscopy. With a total of two patents to his name, Honjo's work focuses on enhancing the capabilities and precision of electron microscopy techniques.

Latest Patents

Honjo's latest patents include innovative methods for calibrating scanning electron microscope objective lenses. One patent details a calibration technique using X-Y voltages that are iteratively determined from images obtained through these voltages. This method allows for objective lens alignment with fewer image acquisitions, improving efficiency in the calibration process. Another patent introduces a tilt-imaging scanning electron microscope apparatus, which features an electron gun, deflectors, an objective electron lens, and a secondary electron detector. This apparatus enables imaging of a target substrate surface at a tilt angle, enhancing the imaging capabilities of scanning electron microscopes.

Career Highlights

Ichiro Honjo is currently employed at KLA-Tencor Corporation, where he continues to develop advanced technologies in the field of electron microscopy. His work has been instrumental in pushing the boundaries of what is possible in imaging and analysis.

Collaborations

Honjo has collaborated with notable colleagues, including Xinrong Jiang and Christopher Malcolm Stanley Sears, contributing to a dynamic research environment that fosters innovation.

Conclusion

Ichiro Honjo's contributions to scanning electron microscopy through his patents and work at KLA-Tencor Corporation highlight his role as a key innovator in the field. His advancements continue to influence the way electron microscopy is utilized in research and industry.