This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 1998.
Company Filing History:
Years Active: 1998
Title: Ichiro Hagino: Innovator in Pattern Inspection Technology
Introduction
Ichiro Hagino is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of pattern inspection technology, particularly in the semiconductor industry. His innovative approach has led to the development of a unique method and apparatus for inspecting patterns composed of reticle data.
Latest Patents
Ichiro Hagino holds 1 patent for his invention titled "Method and apparatus for inspecting patterns composed of reticle data." This patent describes a comprehensive process that includes several key steps. The process begins with a sizing operation where source data for designing a device is combined. Following this, a slit filling process is conducted to eliminate any slits that do not conform to predetermined rules. The patterns obtained from both processes are stored separately, and a logical operation is performed on them. The resulting graphic patterns are analyzed to detect any patterns with dimensions equal to or smaller than a predetermined value. These detected patterns are then classified as false defect patterns, allowing for a clear distinction between false and true defects.
Career Highlights
Ichiro Hagino is currently employed at Fujitsu Corporation, a leading technology company known for its advancements in information technology and telecommunications. His work at Fujitsu has allowed him to collaborate with other talented professionals in the field, enhancing the development of innovative technologies.
Collaborations
One of his notable coworkers is Katsuji Tabara, with whom he has likely shared insights and expertise in their respective areas of specialization.
Conclusion
Ichiro Hagino's contributions to pattern inspection technology exemplify the innovative spirit of the semiconductor industry. His patent reflects a deep understanding of the complexities involved in pattern inspection, showcasing his role as a key inventor in this field.