Location History:
- Seattle, WA (US) (2007)
- Sammamish, WA (US) (2011 - 2016)
Company Filing History:
Years Active: 2007-2016
Title: Ian M Bavey: Innovator in Software Testing and Analysis
Introduction
Ian M Bavey is a notable inventor based in Sammamish, WA (US). He has made significant contributions to the field of software testing and analysis, holding a total of 4 patents. His work focuses on enhancing the efficiency and effectiveness of software projects through innovative methodologies.
Latest Patents
Ian's latest patents include a "Streamlined Testing Experience," which categorizes tests based on their importance in ensuring software functions correctly. This system allows for configurable rules that enable control over the categorization of tests, highlighting important tests in a designated group. Another significant patent is the "Architectural Data Metrics Overlay," which facilitates the analysis of software projects by generating mappings between physical and logical program units. This system allows users to visualize risk areas in software projects and assess the effects of project changes before they are committed to source control.
Career Highlights
Ian M Bavey is currently employed at Microsoft Technology Licensing, LLC, where he continues to innovate in the realm of software development. His work has been instrumental in improving software testing processes and project analysis, making him a valuable asset to his team and the industry.
Collaborations
Ian has collaborated with notable colleagues, including Carlos Garcia Jurado Suarez and Niall L McDonnell. These partnerships have contributed to the development of his innovative patents and have fostered a collaborative environment for advancing software technology.
Conclusion
Ian M Bavey is a distinguished inventor whose contributions to software testing and analysis have made a significant impact in the field. His innovative patents and collaborative efforts continue to drive advancements in software technology.