The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2013
Filed:
May. 12, 2009
Mark Groves, Monroe, WA (US);
Daniel Massey, Redmond, WA (US);
Ian Bavey, Sammamish, WA (US);
David Sauntry, Redmond, WA (US);
Mark Groves, Monroe, WA (US);
Daniel Massey, Redmond, WA (US);
Ian Bavey, Sammamish, WA (US);
David Sauntry, Redmond, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A system and method for facilitating analysis of a software project. Intrinsic measures, activity-based measures, or dynamic measures associated with the project are received, including measures associated with physical program units and logical program units of the project. Mappings between physical program units and logical program units are generated. An architectural diagram including logical program units is received, and may include additional mappings of the logical program units. The mappings are used to roll up measures from physical project units to logical project units, and from logical project units to other logical project units. An overlay diagram is generated, including the rolled up measures. The overlay diagram includes the architectural diagram and a representation of rolled up measures associated with each logical project unit on the diagram. The representations employ a graphic format that facilitates a user determining risk areas of the software project. A user may view effects of project changes prior to checking them into source control.