The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2016

Filed:

Jun. 16, 2011
Applicants:

Peter G. Provost, Denver, CO (US);

Ian M. Bavey, Sammamish, WA (US);

Todd L. King, Bothell, WA (US);

Oscar Calvo-rodriguez, Duvall, WA (US);

Bradley J. Wilson, Redmond, WA (US);

Inventors:

Peter G. Provost, Denver, CO (US);

Ian M. Bavey, Sammamish, WA (US);

Todd L. King, Bothell, WA (US);

Oscar Calvo-Rodriguez, Duvall, WA (US);

Bradley J. Wilson, Redmond, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3409 (2013.01); G06F 11/3684 (2013.01);
Abstract

Tests can be categorized as important with respect to ensuring software functions correctly as a function of one or more rules that define importance. The rules can be configurable to enable control of categorization. Further, tests categorized as important can be highlighted in some manner, for instance by displaying important tests in a group designated for such tests.


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