Cheonan, South Korea

Hyunju Woo

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyunju Woo. Retrieved from https://idiyas.com/inventor/hyunju-woo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hyunju Woo: Innovator in Display Technology

Introduction

Hyunju Woo is a notable inventor based in Cheonan, South Korea. She has made significant contributions to the field of display technology, particularly through her innovative methods for determining crystallinity in materials.

Latest Patents

Hyunju Woo holds a patent titled "Method of determining crystallinity and method of manufacturing a display device using the same." This patent describes a method that includes acquiring a Raman spectrum of crystallized samples. It identifies an optimal sample based on the largest Raman intensity and determines a first normal sample within a specific intensity range. This innovation is crucial for enhancing the manufacturing processes of display devices.

Career Highlights

Hyunju Woo is currently employed at Samsung Display Co., Ltd., a leading company in the display technology sector. Her work has been instrumental in advancing the quality and efficiency of display manufacturing.

Collaborations

Hyunju collaborates with talented coworkers, including Donghoon Lee and Moonsung Choi, who contribute to her innovative projects and research.

Conclusion

Hyunju Woo's contributions to display technology through her patent and work at Samsung Display Co., Ltd. highlight her role as a key innovator in the industry. Her methods for determining crystallinity are set to impact the future of display device manufacturing significantly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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