logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12324345 B1

PDFFull Text
Date of Patent:
Jun. 03, 2025

Filed:

Apr. 27, 2022

Method of determining crystallinity and method of manufacturing a display device using the same

Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Eon Pil Shin, Seoul, KR;

Myoungchul Kim, Suwon-si, KR;

Donghoon Lee, Seongnam-si, KR;

Jihoon Seo, Asan-si, KR;

Yong Woon Lim, Seoul, KR;

Moonsung Choi, Incheon, KR;

Hyunju Woo, Cheonan-si, KR;

Seokwoo Jeong, Yongin-si, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:

KILE PARK REED & HOUTTEMAN PLLC

Primary Examiner:

Nikolay K Yushin

Int. Cl.
CPC ...
H01L 21/66 (2006.01); G01N 21/65 (2006.01); H01L 51/56 (2006.01); H10K 59/122 (2023.01); H10K 71/00 (2023.01); G01N 21/84 (2006.01); H10K 59/12 (2023.01);
U.S. Cl.
CPC ...
H10K 71/00 (2023.02); G01N 21/65 (2013.01); H01L 22/20 (2013.01); H10K 59/122 (2023.02); G01N 2021/8477 (2013.01); H10K 59/1201 (2023.02);
Abstract

A method of determining crystallinity may include acquiring a Raman spectrum of each of samples that are crystallized, determining a first sample that exhibits a first Raman spectrum having a first Raman intensity that is largest among the Raman spectra, as an optimal sample, and determining a second sample that exhibits a second Raman spectrum having a second Raman intensity that is within a range from the first Raman intensity based on the first Raman intensity, as a first normal sample.

Find Patent Forward Citations

Shin, Eon. (2025). Method of determining crystallinity and method of manufacturing a display device using the same (U.S. Patent No. 12324345). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12324345

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…