Seongnam, South Korea

Hyun-Jung Soh

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Sds Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyun-Jung Soh. Retrieved from https://idiyas.com/inventor/hyun-jung-soh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Hyun-Jung Soh: Innovator in Personalized Analysis Systems

Introduction

Hyun-Jung Soh is a notable inventor based in Seongnam-si, South Korea. He has made significant contributions to the field of personalized analysis systems, showcasing his innovative spirit through his patented technology.

Latest Patents

Hyun-Jung Soh holds a patent for a "System and method for analyzing personalized characteristics." This invention provides a comprehensive system that includes an analysis range calculator, an image analyzer, and a characteristic analyzer. The system is designed to calculate various analysis ranges based on positioning data over time, identify objects from image data, and generate personalized characteristic information for the analysis target.

Career Highlights

Hyun-Jung Soh is currently employed at Samsung SDS Co., Ltd., where he continues to develop cutting-edge technologies. His work focuses on enhancing the capabilities of personalized analysis systems, contributing to advancements in various applications.

Collaborations

He collaborates with talented coworkers, including Min-Woo Jung and Hye-Ran Lee, who bring diverse expertise to their projects. Together, they work on innovative solutions that push the boundaries of technology.

Conclusion

Hyun-Jung Soh's contributions to personalized analysis systems exemplify his dedication to innovation. His patent and ongoing work at Samsung SDS Co., Ltd. highlight his role as a key player in the field of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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