The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 2017
Filed:
Dec. 28, 2015
Samsung Sds Co., Ltd., Seoul, KR;
Min-Woo Jung, Yongin-si, KR;
Hyun-Jung Soh, Seongnam-si, KR;
Hye-Ran Lee, Seoul, KR;
Tae-Hwan Jeong, Seoul, KR;
Hyun-Chul Kim, Seoul, KR;
SAMSUNG SDS CO., LTD., Seoul, KR;
Abstract
A system and method for analyzing a personalized characteristic are provided. The system includes an analysis range calculator configured to calculate a plurality of analysis ranges having different analysis times from positioning data according to a lapse of time of an analysis target; an image analyzer configured to identify one or more objects from the image data corresponding to each of the analysis ranges, and analyze one or more visual characteristics from each of the identified objects; and a characteristic analyzer configured to generate personalized characteristic information of the analysis target using a characteristic analysis result of each of the analysis ranges.