Suwon, South Korea

Hyun Jun Yoo

This inventor holds 1 USPTO granted patent. Top assignee: Techwing Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyun Jun Yoo. Retrieved from https://idiyas.com/inventor/hyun-jun-yoo-7y7l22cq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Hyun Jun Yoo in Test Handling Technology

Introduction

Hyun Jun Yoo is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of test handling technology, particularly with his innovative designs that enhance the efficiency and effectiveness of testing processes.

Latest Patents

Hyun Jun Yoo holds a patent for a "Test tray for test handler." This invention introduces a technique where an insert loaded in a loading part, arranged in a matrix pattern within the frame of the test tray, allows for controlled free movement. This design compensates for thermal expansion or contraction of a match plate or the test tray, thereby improving the reliability of test results.

Career Highlights

Hyun Jun Yoo is associated with Techwing Co., Ltd., where he applies his expertise in developing advanced testing solutions. His work has been instrumental in enhancing the capabilities of test handlers, making them more adaptable to various testing conditions.

Collaborations

Some of his coworkers include Jae Gyun Shim and Yun Sung Na, who contribute to the innovative environment at Techwing Co., Ltd. Their collaborative efforts help drive the development of cutting-edge technologies in the industry.

Conclusion

Hyun Jun Yoo's contributions to test handling technology exemplify the impact of innovative thinking in engineering. His patent for a test tray demonstrates a practical solution to common challenges in testing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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