The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 2010

Filed:

Jul. 10, 2008
Applicants:

Jae Gyun Shim, Suwon-si, KR;

Yun Sung NA, Cheonan-si, KR;

IN Gu Jeon, Suwon-si, KR;

Tae Hung Ku, Suwon-si, KR;

Hyun Jun Yoo, Suwon-si, KR;

Inventors:

Jae Gyun Shim, Suwon-si, KR;

Yun Sung Na, Cheonan-si, KR;

In Gu Jeon, Suwon-si, KR;

Tae Hung Ku, Suwon-si, KR;

Hyun Jun Yoo, Suwon-si, KR;

Assignee:

Techwing Co., Ltd., Hwaseong-Si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.


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