Hyun Jong Chung

Title: Hyun Jong Chung: Innovator in Semiconductor Technology

Introduction

Hyun Jong Chung is a prominent inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of semiconductor technology, holding two patents that showcase his innovative approach to photodetection and two-dimensional semiconductors.

Latest Patents

One of his latest patents is titled "Method for detecting intensity as function of energy of light and devices for performing same." This patent discloses a barristor-based photodetector that includes a substrate, a gate electrode laminated on the substrate, and a graphene layer formed between the substrate and the second electrode. This innovative design enhances the performance of photodetectors.

Another notable patent is "Two-dimensional semiconductor, manufacturing method therefor, and semiconductor device comprising same." This invention describes a two-dimensional semiconductor where the energy band gap changes with thickness. It includes a first layer with a specific thickness and a second layer with a different thickness, allowing for advanced semiconductor applications.

Career Highlights

Hyun Jong Chung has worked with notable institutions such as Konkuk University Industrial Cooperation Corporation and the Korea Advanced Institute of Science and Technology. His experience in these organizations has contributed to his expertise in semiconductor research and development.

Collaborations

He has collaborated with talented individuals in his field, including Hyun Cheol Kim and Han Byeol Lee. These collaborations have likely fostered innovative ideas and advancements in their respective projects.

Conclusion

Hyun Jong Chung's contributions to semiconductor technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field, paving the way for future innovations in photodetection and semiconductor devices.