Hyuk-Je Kim

Title: Innovations of Hyuk-Je Kim in Microwave Tomography

Introduction

Hyuk-Je Kim is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of microwave tomography, holding a total of 4 patents. His work focuses on advanced measurement techniques that enhance the capabilities of electromagnetic imaging systems.

Latest Patents

Hyuk-Je Kim's latest patents include a phase measurement device and method in a microwave tomography system. This invention involves transmitting a first Tx frequency signal, receiving a corresponding signal, and measuring a first phase value. It also includes transmitting a second Tx frequency signal, measuring a second phase value, and calculating phase differences to determine an unwrapped phase value. Another notable patent is for electro-magnetic tomography using a modulated signal. This invention features a modulator that uses a pseudo-noise signal to modulate a transmit reference signal, along with a receiver and amplitude detector to measure the received signal's phase.

Career Highlights

Hyuk-Je Kim is affiliated with the Electronics and Telecommunications Research Institute, where he continues to innovate in the field of telecommunications and imaging technologies. His work has been instrumental in advancing the understanding and application of microwave tomography.

Collaborations

He collaborates with esteemed colleagues, including Soon-Ik Jeon and Seong-Ho Son, who contribute to his research and development efforts.

Conclusion

Hyuk-Je Kim's contributions to microwave tomography through his innovative patents demonstrate his expertise and commitment to advancing technology in this field. His work continues to influence the development of more effective imaging systems.