The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2017
Filed:
Sep. 25, 2014
Electronics and Telecommunications Research Institute, Daejeon, KR;
Hyuk-Je Kim, Daejeon, KR;
Jong-Moon Lee, Cheongju-si, KR;
Seong-Ho Son, Daejeon, KR;
Soon-Ik Jeon, Daejeon, KR;
Hyung-Do Choi, Seoul, KR;
Electronics and Telecommunications Research Institute, Daejeon, KR;
Abstract
A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.