Company Filing History:
Years Active: 2024-2025
Title: Innovations by Hyowon Park in Semiconductor Measurement Quality
Introduction
Hyowon Park is an accomplished inventor based in Milpitas, California. She has made significant contributions to the field of semiconductor measurement quality through her innovative patent. Her work focuses on enhancing the accuracy and reliability of semiconductor measurements, which are crucial in various technological applications.
Latest Patents
Hyowon Park holds a patent titled "Methods and systems for targeted monitoring of semiconductor measurement quality." This patent presents methods and systems for monitoring the quality of semiconductor measurements in a targeted manner. Instead of relying on general indices to assess overall measurement quality, her approach involves determining specific targeted measurement quality indicators. These indicators provide insights into whether particular operational issues are negatively impacting measurement quality. By highlighting deficient measurements and identifying specific operational issues contributing to these deficiencies, her invention enhances the overall measurement process. In some embodiments, the values of these indicators are derived from features extracted from measurement data or from comparisons between actual measurement data and data simulated by a trained measurement model.
Career Highlights
Hyowon Park is currently employed at Kla Corporation, a company known for its advanced semiconductor manufacturing equipment and solutions. Her role at Kla Corporation allows her to apply her innovative ideas and contribute to the company's mission of improving semiconductor measurement technologies.
Collaborations
Hyowon has collaborated with notable colleagues, including Antonio Arion Gellineau and Andrei V Shchegrov. These collaborations have likely enriched her work and contributed to the development of her innovative patent.
Conclusion
Hyowon Park's contributions to semiconductor measurement quality through her innovative patent demonstrate her expertise and commitment to advancing technology in this critical field. Her work not only addresses measurement deficiencies but also provides valuable insights into operational issues, paving the way for improved semiconductor manufacturing processes.