Hyo-jin Oh

Title: Hyo-jin Oh and High-Frequency Delay-Locked Loop Technology.

Introduction

Hyo-jin Oh is an inventor associated with Kyungki-do, South Korea, and Samsung Electronics Co., Ltd. Her patent work addresses integrated circuit design, with a focus on delay-locked loop technology that can operate at high frequencies in both normal and test modes.

Latest Patents

Oh is named on one patent: “Integrated Circuit Devices Having a Delay Locked Loop That Is Configurable for High-Frequency Operation During Test and Methods of Operating Same.” The invention describes an integrated circuit device with a delay-locked loop (DLL) that can operate at high frequency during normal operation and testing, including burn-in testing.

The disclosed device uses a DLL control circuit that generates a control signal in response to a test-mode signal. An oscillator circuit generates a clock signal, which can run at a high frequency comparable to the clock used during normal operation. The DLL responds to that clock and uses the control signal to operate in either test mode or normal mode. This approach enables evaluation under test conditions that more closely resemble the device’s operating conditions.

Career Highlights

Oh’s listed patent reflects work on circuit testing and performance evaluation. By enabling high-frequency DLL operation during burn-in testing, the invention aims to support assessment under conditions comparable to normal use.

Collaborations

The patent lists Jong-soo Lee and Sang-chul Kim as Oh’s coworkers. The invention is associated with Samsung Electronics Co., Ltd.

Conclusion

Hyo-jin Oh’s patent contributes to integrated circuit testing by describing a delay-locked loop designed for high-frequency operation in both test and normal modes.