Daejeon, South Korea

Hye Jin S Kim

This inventor holds 1 USPTO granted patent. Top assignee: Electronics and Telecommunications Research Institute. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hye Jin S Kim. Retrieved from https://idiyas.com/inventor/hye-jin-s-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hye Jin S Kim: Innovator in Dimension Measurement Technology

Introduction

Hye Jin S Kim is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of measurement technology, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of dimension measurement processes.

Latest Patents

Hye Jin S Kim holds a patent for an "Apparatus and method for measuring dimension." This invention discloses a method that includes photographing a target object and generating an image. The process involves normalizing the image of the target object and generating normalized estimated dimension information using a pre-trained dimension prediction model. Finally, the normalized estimated dimension information is converted into estimated dimension information of the target object. This patent showcases his expertise in developing advanced measurement techniques.

Career Highlights

Hye Jin S Kim is affiliated with the Electronics and Telecommunications Research Institute, where he continues to innovate and contribute to research in measurement technologies. His work has implications for various industries that require precise dimension measurements.

Collaborations

Hye Jin S Kim collaborates with Ji Yeon Son, who is also a key figure in his research endeavors. Their partnership enhances the development of innovative solutions in their field.

Conclusion

Hye Jin S Kim's contributions to measurement technology through his patent demonstrate his commitment to innovation. His work not only advances the field but also sets a foundation for future developments in dimension measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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